Non-contact two-dimensional spectral measurement system
It can conduct non-contact measurements on various objects that cannot be measured by traditional spectrophotometers, including objects with multiple colors, small sizes, curved surfaces, irregular shapes, powders, etc., to achieve accurate and objective measurements.
Applications: Industrial sorting and defect detection\Textile color measurement\Plastic products\Printed matter\Coatings and paints measurement
It can conduct non-contact measurements on various objects that cannot be measured by traditional spectrophotometers, including objects with multiple colors, small sizes, curved surfaces, irregular shapes, powders, etc., to achieve accurate and objective measurements.
Applications: Industrial sorting and defect detection\Textile color measurement\Plastic products\Printed matter\Coatings and paints measurement
Measurement wavelength: 400~1000nm, software can set 400~700nm
Measuring geometric conditions: 45°:0° can be customized
Non-contact measurement distance: 30~80cm, customizable distance
Short-term repeatability: The color difference of repeated measurements of the white board 20 times does not exceed 0.05
Number of spatial channels: 2400, each graphic element corresponds to the actual sample measurement size <0.08mm / 800, each graphic element corresponds to the actual sample measurement size <0.2mm
Spectral resolution: ≤2nm / ~5nm Two models to choose from
The software can output key QC parameters, including two-dimensional reflectance, CIELab values, etc.
Maximum illumination: ~80000 lux Two light sources to the storage platform. If four light sources are used, the maximum illumination will be doubled.
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